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Masking Circuit Faults and Trojan Circuit Injections Using Sat Solvers
Authors:Маtrosova  A Yu  Provkin  V А  Tychinskiy  V Z  Nikolaeva  Е А  Goshin  G G
Institution:1.National Research Tomsk State University, Tomsk, Russia
;2.Tomsk State University of Control Systems and Radioelectronics, Tomsk, Russia
;
Abstract:Russian Physics Journal - Combinational circuit C composed of gates and its sub-circuit with set V of output nodes and set U of input nodes are considered. The set V consists of output nodes of...
Keywords:
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