首页 | 本学科首页   官方微博 | 高级检索  
     


A Reflectron Time-of-Flight Mass Spectrometer with a Nano-Electrospray Ionization Source for Study of Metal Cluster Compounds
Authors:Xiao-hu Wu  Hua Xie  Zhi-ling Liu  Hai-feng Su  Shui-chao Lin  Zi-chao Tang
Abstract:An experiment facility has been set up for the study of metal cluster compounds in our laboratory, which consists of a nano-electrospray ionization source, an ion transmission and focus system, and a reflectron time-of-flight mass spectrometer. Taking advantage of the nano-electrospray ionization source, polyvalent ions are usually produced in the “ionization” process and the obtained mass resolution of the equipment is over 8000. The molecular ion peaks of metal cluster compounds [Au20(PPhpy2)10Cl2](SbF6)4, where PPhpy2=bis(2-pyridyl)phenylphosphine, and [Au6Ag2(C)L6](BF4)4, where L=2-(diphenylphosphino)-5-methylpyridine, are distinguished in the respective mass spectrum, accompanied by some fragment ion peaks. In addition, the mass-to-charge ratios of the parent ions are determi-nated. Preliminary results suggest that the device is a powerful tool for the study of metal cluster compounds. It turns out that the information obtained by the instrumentation serves as an essential supplement to single crystal X-ray diffraction for structure characterization of metal cluster compounds.
Keywords:Nano-electrospray ionization source   Ion transmission and focus system   Reflectron time-of-flight mass spectrometer   Metal cluster compounds   Single crystal X-ray diffraction
点击此处可从《化学物理学报(中文版)》浏览原始摘要信息
点击此处可从《化学物理学报(中文版)》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号