Adsorption at liquid interfaces: A comparison of multiple experimental techniques |
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| Authors: | B. M. Law M.D. Brown L. Marchand L. B. Lurio W. A. Hamilton I. Kuzmenko T. Gog S. Satija E. Watkins J. Majewski |
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| Affiliation: | (1) Physics Department, Kansas State University, Manhattan, KS 66506, USA;(2) Physics Department, Northern Illinois University, DeKalb, IL 60115, USA;(3) Bragg Institute, ANSTO, Lucas Heights, New South Wales, 2234, Australia;(4) Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA;(5) National Institute of Standards and Technology, Gaithersburg, MD 20899, USA;(6) Los Alamos National Laboratory, Los Alamos, NM 87545, USA |
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| Abstract: | It has proven to be a challenging task to quantitatively resolve the interfacial profile at diffuse interfaces, such as, the adsorption profile near a bulk binary liquid mixture critical point. In this contribution we examine the advantages and disadvantages of a variety of experimental techniques for studying adsorption, including neutron reflectometry, X-ray reflectometry and ellipsometry. Short length scale interfacial features are best resolved using neutron/X-ray reflectometry, whereas, large length scale interfacial features are best resolved using ellipsometry, or in special circumstances, neutron reflectometry. The use of multiple techniques severely limits the shape of the adsorption profile that can describe all experimental data sets. Complex interfaces possessing surface features on many different length scales are therefore best studied using a combination of neutron/X-ray reflectometry and ellipsometry. |
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