Enhanced instability in thin liquid films by improved compatibility |
| |
Authors: | Reiter Khanna Sharma |
| |
Institution: | Institut de Chimie des Surfaces et Interfaces, CNRS, 15, rue Jean Starcky, BP 2488, 68057 Mulhouse Cedex, France. |
| |
Abstract: | We investigated experimentally the morphological evolution of thin polydimethylsiloxane films sandwiched between a silicon wafer and different bounding liquids with interfacial tensions varying by 2 orders of magnitude. It is shown that increasing the compatibility between film and bounding liquid by adding a few surfactant molecules results in a faster instability of shorter characteristic wavelength. Inversely, based on the characteristic parameters describing the instability we determined extremely small interfacial tensions with a remarkable accuracy. |
| |
Keywords: | |
本文献已被 PubMed 等数据库收录! |
|