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Hot-electron effects in two-dimensional hopping with a large localization length
Authors:Gershenson   Khavin   Reuter   Schafmeister   Wieck
Affiliation:Serin Physics Laboratory, Rutgers University, Piscataway, New Jersey 08854-8019, USA.
Abstract:We have studied nonlinear effects in the resistance of a two-dimensional system with a large localization length on both sides of the crossover from weak to strong localization. It is shown that nonlinearity in the hopping regime is due to electron overheating rather than the field effects. This qualitatively new behavior is a signature of a two-dimensional hopping transport with a large localization length.
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