Improved transformed deviance statistic for testing a logistic regression model期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

按检索

Improved transformed deviance statistic for testing a logistic regression model

Authors:	Nobuhiro Taneichi Yuri Sekiya

Institution:	^a Department of Mathematics and Computer Science, Graduate School of Science and Engineering, Kagoshima University, 1-21-35 Korimoto, Kagoshima 890-0065, Japan ^b Kushiro Campus, Hokkaido University of Education, Kushiro 085-8580, Japan ^c Division of Computer Science, Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0814, Japan

Abstract:

Keywords:	62E20 62H10
本文献已被 ScienceDirect 等数据库收录！