Yb掺杂C60薄膜的x射线光电子能谱研究

在超高真空系统中制备了C₆₀的Yb填隙化合物薄膜.用x射线光电子能谱研究了Yb和C₆₀结合过程中C 1s，Yb 4f和Yb 4d的变化.利用Yb 4f和C 1s的谱峰强度确定出相纯样品的化学组分接近Yb_2.75C₆₀，这一结果与晶体x射线衍射结果一致.Yb 4f和Yb 4d的峰形与峰位表明化合物中Yb的价态为Yb²⁺.相纯样品（Yb_2.75C₆₀）的C 关键词：60的Yb填隙化合物薄膜')" href="#">C₆₀的Yb填隙化合物薄膜x射线光电子能谱Yb价态

X-ray photoemission studies of Yb intercalated C60 thin film

Yb-intercalated C₆₀ thin film was prepared in a ultra-high-vacuum system. The binding energies of C 1s, Yb 4f and Yb 4d during the compound formation were studied by x-ray photoemission technique. The stoichiometry of the phase-pure sample was determined by the peak intensities of Yb 4f and C 1s. The result turned to be very near to that for Yb_2.75C₆₀ that was first determined for bulk-phase sample by x-ray diffraction measurement. The positions and intensities of the Yb 4f and Yb 4d peaks revealed the charge state of Yb²⁺ in Yb_2.75C₆₀. The C 1s core level for the phase-pure sample shifted towards lower binding energy by ≈0.5 eV relative to C₆₀, which exhibited that some Yb 6s electrons transferred from Yb to the lowest unoccupied molecular orbital band of C₆₀. The shift and the FWHM of C 1s x-ray photoemission spectroscopic peak can be used as sample characterization in future researches on Yb/C₆₀ compounds.