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The temperature dependence of single-event transients in 90-nm CMOS dual-well and triple-well NMOSFETs |
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| Authors: | Li Da-Wei Qin Jun-Rui and Chen Shu-Ming |
| Affiliation: | College of Computer,National University of Defense Technology,Changsha 410073,China |
| Abstract: | |
| Keywords: | single event transient temperature dependence dual-well triple-well N^＋ deep well |
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