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Electron spin lifetimes in Hg0.78Cd0.22 Te and InSb
Authors:P. Murzyn   C. R. Pidgeon   P. J. Phillips   J. -P. Wells   N. T. Gordon   T. Ashley   J. H. Jefferson   T. M. Burke   J. Giess   M. Merrick   B. N. Murdin  C. D. Maxey
Affiliation:a Department of Physics, Heriot-Watt University, Edinburgh EH14 4AS, UK;b QinetiQ, St. Andrews Road, Malvern, Worcs WR14 3PS, UK;c Department of Physics, University of Surrey, Guildford GU2 7XH, UK;d BAE Systems Infra Red Ltd., Southampton SO15 0EG, UK
Abstract:We have made direct pump–probe measurements of spin lifetimes in long wavelength narrow-gap semiconductors at wavelengths between 4 and 10 μm and from 4 to 300 K. In particular, we measure remarkably long spin lifetimes, τs300 ps, even at 300 K for epilayers of degenerate n-type InSb. In this material the mobility is approximately constant between 77 and 300 K, and we find that τs is approximately constant in this temperature range. In order to determine the dominant spin relaxation mechanism we have investigated the temperature dependence of τs in non-degenerate lightly n-type Hg0.78Cd0.22Te of approximately the same band gap as InSb, and find that τs varies from 356 ps at 150 K to 24 ps at 300 K. Our results, both in magnitude and temperature dependence of τs, imply that the Elliott–Yafet model dominates in these materials.
Keywords:Narrow-gap semiconductors   Spin lifetime   Spin relaxation   Optical pumping
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