Detection of surface atoms by energy analysis of scattered primaries and recoiled secondaries from CsBr under Ar+ and Ar+ bombardment |
| |
| Authors: | J.AIbert Schultz Ranjit Kumar J.Wayne Rabalais |
| |
| Affiliation: | Department of Chemistry, University of Houston, Houston, Texas 77004, USA |
| |
| Abstract: | Time-of-flight (TOF) and electrostatic sector analysis (ESA) have been used to measure particles scattered and sputtered by direct recoils and surface recoils during 3 keV Ar+ and 6 keV Ar2+ bombardment of CsBr at forward and backscattering angles. Charge fractions of scattered argon and recoiling surface atoms are obtained. Hydrogen and oxygen surface impurities are detected predominantly as directly recoiled neutrals. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
