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Measurements of third-order nonlinearity of inhomogeneous samples using nonlinear-imaging technique with a phase object
Authors:Y. Li  Y. Song  T. Wei  C. He  X. Zhang  Y. Wang  K. Yang  M. Shen  J. Yang
Affiliation:(1) School of Physical Science and Technology, Suzhou University, Suzhou, 215006, P.R. China;(2) Department of Physics, Harbin Institute of Technology, Harbin, 150001, P.R. China;(3) Laboratory of Functional Materials, School of Chemistry and Materials Science, Heilongjiang University, Harbin, 150080, P.R. China
Abstract:Using electrostatic self-assembly of a [CuPc(COOH)4]/polydiallyldimethylammonium chloride (PDDA) film, we demonstrate that signal fluctuation induced by a random surface inhomogeneity of less than 70 nm can be approximately resolved by a nonlinear-imaging technique with a phase object (NIT-PO) as opposed to Z-scan. In our NIT-PO simulation the sample is regarded as perfectly parallel, while the incident intensity distribution is modified to mimic that of an extremely weak laser beam traversing the sample, which is detected by a charge-coupled-device (CCD) camera. However, the original phase in the simulations is maintained, since phase distortions caused by the sample are not measurable at the CCD plane. PACS 42.30.Kq; 42.65.-k
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