Resolution improvement in optical projection tomography by the focal scanning method |
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| Authors: | Miao Qin Hayenga Jon Meyer Michael G Neumann Thomas Nelson Alan C Seibel Eric J |
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| Institution: | Department of Bioengineering, University of Washington, 1705 Northeast Pacific Street, Seattle, Washington 98195, USA. miaoq@u.washington.edu |
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| Abstract: | Optical projection tomography (OPT) requires the depth of field (DOF) of the lens to cover at least half of the sample. There is a trade-off between obtaining high resolution with a high-NA lens and obtaining large DOF with a low-NA lens. The DOF of a high-NA objective lens can be extended by scanning its focal plane through the sample. We call this extended DOF image a "pseudoprojection." Images reconstructed from these pseudoprojections have isometric resolution, which can be the same as the lateral resolution of the high-NA objective. The focal scanning method produces an over 10× improvement in OPT resolution. |
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