红外焦平面阵列测试虚拟仪器系统

红外焦平面阵列主要性能参数的测试和评价是研制、生产和应用阵列的基础.由于焦平面阵列的像元数太多,所以测试复杂且计算繁琐.基于虚拟仪器技术构建的红外焦平面阵列测试系统,能完成焦平面阵列的特性参数定量测试和成像实验.在大幅度降低测试成本的同时,系统还具有易于扩展、升级和修改的优势,从而为红外焦平面阵列的研制提供了有效的测试与实验技术手段.

IRFPA Testing Virtual Instrument System

Testing and estimating Infrared Focal Plane Arrays (IRFPA) main performance parameters is a foundation of researching, manufacturing and utilizing such a chip. Because the number of the image pixels on a Focal Plane Arrays (FPA) is too large, it is complexly and numerously to test and account the chip parameters. Under Virtual Instrument Technology, an IRFPA testing system has been made to take the chip quantification respective parameters and achieve the infrared video signals image. The testing system can be easily expanded, upgraded and corrected while the fee of the test drastically dropped, which provides useful means to test and experiment the main performance of IRFPA.