| Optical Recording Performance of In_（47）Sb_（14）Te_（39）Phase Change Thin Films using 514．5nm Wavelength Laser Beam |
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| 作者姓名： | MEN Liqiu JIANG Fusong GAN Fuxi |
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| 作者单位： | Shanghai Institute of Optics and Fine Mechanixs，Chinese Academy of Sciences P. O. Box 800-216，Shanghai 201800，China |
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| 摘 要： | ＯｐｔｉｃａｌＲｅｃｏｒｄｉｎｇＰｅｒｆｏｒｍａｎｃｅｏｆＩｎ_（４７）Ｓｂ_（１４）Ｔｅ_（３９）ＰｈａｓｅＣｈａｎｇｅＴｈｉｎＦｉｌｍｓｕｓｉｎｇ５１４．５ｎｍＷａｖｅｌｅｎｇｔｈＬａｓｅｒＢｅａｍ￥ＭＥＮＬｉｑｉｕ；ＪＩＡＮＧＦｕｓｏｎｇ；ＧＡＮ?..
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| 收稿时间： | 1996/1/24 |
Optical Recording Performance of In_(47)Sb_(14)Te_(39)Phase Change Thin Films using 514. 5 nm Wavelength Laser Beam |
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| MEN Liqiu,JIANG Fusong,GAN Fuxi.Optical Recording Performance of In_(47)Sb_(14)Te_(39)Phase Change Thin Films using 514. 5 nm Wavelength Laser Beam[J].中国激光(英文版),1996,5(4):341-348. |
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| Authors: | MEN Liqiu JIANG Fusong GAN Fuxi |
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| Abstract: | Optical absorption spectra of In47Sb14Te39 thin films preared by D. C. magnetron sputtering method are studied. A compeatively large adoption has been oberved in the wavelength region of 400～600 μm which matches with the wavelength of Algon laser.X-ray diffraction and DSC results indicate that the crystallization compounds include mainly In3SbTe2 with small amounts of InTe,In2Te3. Optical recording ted of the films show clearlythat larser reflectivity contrast can be obtained at lower Argon laser (514.5 nm) irradiation. The Earsing contrast is comparatively lower but can be improved by multi-films match. |
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| Keywords: | phase change materials short-wavelength recotding X-ray diffraction |
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