Micromechanical Photonics: Microresonator Displacement Measurement by an Extremely-Short-Length External Cavity Laser Diode |
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Authors: | Hiroo UKITA Yoshio SUZUKI |
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Institution: | (1) Nippon Telegraph and Telephone Corporation, NTT Interdisciplinary Research Laboratories, 3-9-11, Midori-cho, Musashino, Tokyo 180, Japan |
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Abstract: | A composite cavity laser diode was used to monitor the displacement of the external cavity microresonator from the phase difference in the near field. The carrier-to-noise ratio was very high (more than 45 dB) because of the lack of mode hopping noise due to the extremely short (less than 3 μm) external cavity length and strong optical feedback. The small distance (near field) allows a lensless system, making it easier to integrate on a gallium arsenide (GaAs) substrate. |
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Keywords: | composite cavity laser diode phase difference displacement measurement near field microresonator micromechanical photonics photomicrodynamics |
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