Lattice parameter and alloy fraction determination of Pb x Sn1−x Te films by RHEED double-patterns |
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| Authors: | G. Vitali E. Fainelli G. Petrocco |
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| Affiliation: | (1) Istituto di Fisica-Facoltà di Ingegneria-Università di Roma and G.N.S.M., Rome, Italy;(2) G.N.S.M.-C.N.R.-Laboratorio Elettronica dello Stato Solido, Rome, Italy |
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| Abstract: | A new technique to determine simultaneously the structure, the lattice parameter and the alloy stoichiometric composition of Pb x Sn1−x Te films r.f. sputtered into different substrates has been developed by making use of Reflection High Energy Electron Diffraction (RHEED) double-patterns. This method is available with all the materials for which the lattice constant is related to the alloy composition. |
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| Keywords: | 68.50 61 |
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