Tetracene film morphology: Comparative atomic force microscopy, X-ray diffraction and ellipsometry investigations |
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| Authors: | B Gompf D Faltermeier C Redling M Dressel J Pflaum |
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| Institution: | 1. 1. Physikalisches Institut, Universit?t Stuttgart, Pfaffenwaldring 57, D-70550, Stuttgart, Germany
2. 3. Physikalisches Institut, Universit?t Stuttgart, Pfaffenwaldring 57, D-70550, Stuttgart, Germany
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| Abstract: | X-ray diffraction, atomic force microscopy and spectroscopic ellipsometry were used to study tetracene thin films as a function
of deposition rate. A comparative analysis of the thickness and roughness values allows for detailed modelling of the film
morphology. An interdigitated growth mode is established for the coexisting thin film and bulk phases. By comparison with
the respective quinone-derivative of tetracene, we were additionally able to identify reaction products by their optical response. |
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| Keywords: | PACS" target="_blank">PACS 68 55 -a Thin film structure and morphology 68 55 am Polymers and organics 78 66 Qn Polymers organic compounds |
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