Surface forces and the stability of colloids and disperse systems

There are discussed two factors controlling the thickness h of a free film of liquid between two bubbles of radius R pressed against one another, the mechanical properties of the film and the temperature. The role of the viscosity, η, is analyzed on the basis of the formula h = 2.64 R(ηu/σ)^2/3 (σ surface tension, u thereceding velocity of the film perimeter), which is the simple consequence of the formula for the thickness of the film left behind the receding wetting perimeter (Derjaguin, 1943). A similar formula is also used for the analysis of the role of yield value of the film. The temperature does not change the thickness of the black free films (100A.) in contrast to the thicker films governed by electric repulsion. The jumpwise thinning of free films is studied by microfilming.

The method of crossed polarized metal wires is described, which permits measurement of the potential barrier preventing metallic contact in liquid media. The measurements of this barrier in water solutions of electrolytes as a function of potential of the wires are interpreted on the basis of our theory of colloid stability. The existence of repulsive forces (disjoining pressure) at high electrolyte concentrations independent of the potential proves their nonelectrostatic origin. These measurements were also used to calculate Hamaker's constant of molecular attraction and to determine the potential of zero charge of some metals.