Analytical modelling of carrier transport mechanisms in long wavelength planar n+–p HgCdTe photovoltaic detectors

The dark electrical characteristic of n⁺ on p long wavelength Hg_1−xCd_xTe photovoltaic detectors has been studied as a function of applied bias voltages. The diodes under study were given different surface treatments prior to their passivation. The dark current components have been identified using the already known carrier transport mechanisms across the junction. It is reported that the diodes under investigation have an excess leakage current component that exhibits quadratic dependence on the applied reverse bias voltage across the diode. The origin of this excess current is found to be closely associated with the ohmic currents. The diodes with higher ohmic current exhibit higher excess leakage current.