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Sensitivity of imaging properties of metal-dielectric layered flat lens to fabrication inaccuracies |
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| Authors: | R Kotyński H Baghdasaryan T Stefaniuk A Pastuszczak M Marciniak A Lavrinenko K Panajotov and T Szoplik |
| Institution: | 1.Faculty of Physics,University of Warsaw,Warsaw,Poland;2.Fiber Optics Communication Laboratory,State Engineering University of Armenia,Yerevan,Armenia;3.National Institute of Telecommunications,Warsaw,Poland;4.Department of Photonics Engineering,Technical University of Denmark,Kgs. Lyngby,Denmark;5.Department of Applied Physics and Photonics Vrije Universiteit Brussel, (IR-TONA),Brussels,Belgium;6.Institute of Solid State Physics,Bulgarian Academy of Sciences,Sofia,Bulgaria |
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