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具有双栅的部分薄膜LIGBT
引用本文:罗小蓉,雷磊,张伟,张波,李肇基. 具有双栅的部分薄膜LIGBT[J]. 半导体学报, 2010, 31(2): 024002-4
作者姓名:罗小蓉  雷磊  张伟  张波  李肇基
作者单位:State;Laboratory;Electronic;Thin;Films;Integrated;Devices;University;Science;Technology;China;
摘    要:本文提出一种新型的具有阴极栅和阳极栅的部分薄膜SOI LIGBT。正向导通状态下,当负压加在阳极栅上时,器件具有低导通电阻。在阻断状态下,阴极栅和阳极栅分别短接在发射极和收集极,导致高开关速度。而且,漂移区以下部分硅衬底的刻蚀避免在埋氧层下界面聚集电荷,这使得电势线可以释放到薄膜以下,因而产生高击穿电压。再有,无衬底-漏极电容使器件具有高开关速度。最后,漂移区横向均匀和线形掺杂相结合的浓度分布不仅提高了耐压,而且降低了导通电阻。与常规LIGBT相比,提出的新结构展示了高电流容量,高开关速度,低导通电阻和2倍的击穿电压。

关 键 词:LIGBT  绝缘栅双极晶体管    双门  通态电阻  快速开关  击穿电压  开关速度
收稿时间:2009-07-29
修稿时间:2009-10-06

Double gate lateral IGBT on partial membrane
Luo Xiaorong,Lei Lei,Zhang Wei,Zhang Bo and Li Zhaoji. Double gate lateral IGBT on partial membrane[J]. Chinese Journal of Semiconductors, 2010, 31(2): 024002-4
Authors:Luo Xiaorong  Lei Lei  Zhang Wei  Zhang Bo  Li Zhaoji
Affiliation:State Key Laboratory of Electronic Thin Films and Integrated Devices, University of ElectronicScience and Technology of China, Chengdu 610054, China;State Key Laboratory of Electronic Thin Films and Integrated Devices, University of ElectronicScience and Technology of China, Chengdu 610054, China;State Key Laboratory of Electronic Thin Films and Integrated Devices, University of ElectronicScience and Technology of China, Chengdu 610054, China;State Key Laboratory of Electronic Thin Films and Integrated Devices, University of ElectronicScience and Technology of China, Chengdu 610054, China;State Key Laboratory of Electronic Thin Films and Integrated Devices, University of ElectronicScience and Technology of China, Chengdu 610054, China
Abstract:A new SOILIGBT(lateral insulated-gate bipolar transistor) with cathode-and anode-gates on partial membrane is proposed.A low on-state resistance is achieved when a negative voltage is applied to the anode gate.In the blocking state,the cathode gate is shortened to the cathode and the anode gate is shortened to the anode,leading to a fast switching speed.Moreover,the removal of the partial silicon substrate under the drift region avoids collecting charges beneath the buried oxide,which releases potential lin...
Keywords:SOI   LIGBT   on-resistance   breakdown voltage   switching speed
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