首页 | 本学科首页   官方微博 | 高级检索  
     

硒化技术对CuInSe2薄膜表面形貌和晶相的影响
引用本文:李 健,朱 洁. 硒化技术对CuInSe2薄膜表面形貌和晶相的影响[J]. 物理学报, 2007, 56(1): 574-582
作者姓名:李 健  朱 洁
作者单位:北京科技大学新金属材料国家重点实验室,北京 100083;北京科技大学新金属材料国家重点实验室,北京 100083
基金项目:北京科技大学“422高层次创新人才工程”(批准号:00007411)资助的课题.
摘    要:以共溅射法制备的Cu-In预制膜为衬底材料,以硒粉为原料,尝试了几种特殊的硒化方案,包括单源硒化法、双源硒化法、表面喷粉硒化法、分步硒化退火和同步硒化退火等5种具有代表性和创新性的方案,研究了硒源的摆放方式、升温方法对薄膜质量的影响,比较了不同方法制备的CuInSe2(CIS)薄膜在形貌、成分、相结构等方面的异同. 系统地分析了硒化温度、退火温度和退火时间对CuInSe2薄膜成分的影响,研究了各元素的百分含量随硒化退火条件的变化规律,为更准确地把握CIS薄膜的成分和相结构提供有益的借鉴.

关 键 词:Cu-In预置膜  共溅射  硒化  CIS膜
文章编号:1000-3290/2007/56(01)/574-09
收稿时间:2005-12-08
修稿时间:2005-12-08

Influence of selenization on the surface morphology and phase structure of CuInSe2 thin films
Li Jian and Zhu Jie. Influence of selenization on the surface morphology and phase structure of CuInSe2 thin films[J]. Acta Physica Sinica, 2007, 56(1): 574-582
Authors:Li Jian and Zhu Jie
Affiliation:State Key laboratory for Advanced Metals and Materials University of Science and Technology Beijing,Beijing 100083, China
Abstract:Co-sputtered Cu-In precursors were used as the backing materials, and selenium powder was employed as the raw materials. Five kinds of representative or innovative selenization schemes, including single selenium source, double selenium source, powder spraying, selenizing and annealing step by step or simultaneously, were applied to grow CuInSe2(CIS) thin films. The influence of selenium source location and temperature rising methods on the property of CIS films was evaluated. The similarities and differences in the morphology, composition and phase structure among different methods were compared. The relationship between selenization temperature, anneal temperature, anneal time and the composition of CIS thin films was researched. The rules how element percent alters with the selenization and anneal condition are established, which can provide a reference to better control the composition and phase structure of CIS thin films.
Keywords:Cu-In precursor   co-sputtering   selenization   CIS thin films
本文献已被 CNKI 维普 等数据库收录!
点击此处可从《物理学报》浏览原始摘要信息
点击此处可从《物理学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号