Ultrasonic measurements of the elastic moduli of ultradrawn polyoxymethylene

We have employed an ultrasonic method to measure from ?40 to 60°C the five independent elastic moduli C₁₁, C₁₃, C₃₃, C₄₄, and C₆₆ of polyoxymethylene with draw ratio λ from 1 to 26 prepared by continuous drawing under microwave heating. The elastic moduli are controlled by three major factors: molecular orientation in the crystalline regions, fraction of noncrystalline taut tie molecules, and void content. The steep rise in the axial extensional modulus C₃₃ and axial Young's modulus E₀ with increasing draw ratio results from the alignment of chains in the crystalline blocks and an increase in the number of disordered taut tie molecules. Below the γ relaxation (located at 0°C at our measurement frequency of 10 MHz), these two factors also give rise to a slight decrease in the transverse extensional modulus C₁₁, Young's modulus E₉₀ and shear modulus C₆₆. At high temperature where the amorphous regions have very low modulus, the stiffening effect of taut tie molecules becomes dominant, leading to an increase in all moduli as λ increases from 1 to 10. At higher λ the void fraction increases appreciably, causing small decreases in E₉₀, C₁₁, and C₆₆ at all temperatures.