|
|||||
|
|
Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable hi-layer number by X-ray reflection and diffuse scattering |
|
| Authors: | Min Dai Zhong Zhang Jingtao Zhu Xiaoqiang Wang Jing Xu Xiuhua Fu Liang Bai Qiushi Huang Zhanshan Wang Lingyan Chen |
| Abstract: | from layer to layer during multilayer growing. The variation of the reflectivity and interface roughness with bi-layer number is accurately explained by the presented real-structure model. |
| Keywords: | |
| 本文献已被 万方数据 等数据库收录！ | |