| Institution: | (1) INFM, Dipartimento di Fisica, Università di Padova, via Marzolo 8, 35131 Padova, Italy, IT;(2) INFM, European Synchrotron Radiation Facility, GILDA-CRG, BP 220, 38043 Grenoble, France, FR;(3) INFM, Dipartimento di Chimica Fisica, Università di Venezia, Dorsoduro 2137, 30123 Venezia, Italy, IT;(4) INFM, Dipartimento di Fisica, Universitá di Trento, 38050 Povo-Trento, Italy, IT;(5) CNR-CeFSA, Centro Fisica Stati Aggregati, 38050 Povo-Trento, Italy, IT |
| Abstract: | Composite silica films containing metal nanoclusters were prepared by the rf- sputtering technique, in which SiO2 was co-deposited with gold+copper, gold+silver, or copper+silver. The formation of either pure or alloy clusters was studied
by extended X-ray absorption fine structure spectroscopy and transmission electron microscopy. For all systems, the presence
of alloy aggregates was evidenced. Moreover, small amounts of pure metal aggregates as well as dispersed or oxidized dopants
were observed.
61.46.+w Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals – 61.10.Ht X-ray absorption spectroscopy:
EXAFS, NEXAFS, XANES, etc. – 81.05.Pj Glass-based composites, vitroceramics
Received 29 June 2001 |
