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Carbon thin films through laser ablation
Authors:RK Thareja  RK Dwivedi
Institution:Department of Physics and Centre for Laser Technology, Indian Institute of Technology, Kanpur 208016, India
Abstract:Thin carbon films were deposited on silicon substrates at room temperature using a 0.355 μm Nd:YAG laser wavelength at low irradiance in the presence of argon gas. Various techniques including scanning electron microscopy, X-ray diffraction and Raman spectroscopy were used to analyze the film quality. The influence of the argon gas pressure on the properties of the films is demonstrated and a correlation with the optical emission data is presented.
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