| 半导体光电探测器响应度测试装置的研制 |
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| 引用本文： | 刘晖,朱日宏,朱煜,陈进榜.半导体光电探测器响应度测试装置的研制[J].光学学报,1999,19(11):581-1584. |
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| 作者姓名： | 刘晖 朱日宏 朱煜 陈进榜 |
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| 作者单位： | 南京理工大学电光学院,南京210094 |
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| 摘 要： | 分析了半导体光电探测器光谱响应度的测试原理；研制了一套波长为０．４～１．１μｍ的光谱响度测试装置。该装置采用双光路替代法，可以测试绝对光谱响应度、相对光谱响应度和量子效率，并可减小光源不稳定性对测试结果的影响，最终给出了测试结果比对。
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| 关 键 词： | 相对光谱响应度 绝对光谱响应度 量子效率 单色仪 |
| 收稿时间： | 1998/6/15 |
A Device for Testing Spectral Responsivity of Semiconductor Photodetector |
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| Liu Hui,Zhu Rihong,Zhu Yu,Chen Jinbang.A Device for Testing Spectral Responsivity of Semiconductor Photodetector[J].Acta Optica Sinica,1999,19(11):581-1584. |
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| Authors: | Liu Hui Zhu Rihong Zhu Yu Chen Jinbang |
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| Abstract: | The testing of spectral responsivity of semiconductor photo detector is discussed. A device used for testing spectral responsivity with wavelength ranged from 0.4～1.1 μm is developed. It can be used to test relative spectral responsivity, absolute spectral responsivity and quantum efficiency, and the effect of instability of source can be eliminated. The testing results are compared. |
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| Keywords: | relative spectral response absolute spectral response quantum efficiency monochromater |
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