| X射线荧光光谱法测定工业硅中铁、铝、钙 |
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| 引用本文： | 谷松海,李旭辉.X射线荧光光谱法测定工业硅中铁、铝、钙[J].光谱学与光谱分析,2001,21(4):569-571. |
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| 作者姓名： | 谷松海 李旭辉 |
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| 作者单位： | 天津出入境检验检疫局, |
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| 基金项目： | 国家商检局科技基金资助 |
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| 摘 要： | 通过压片法制备样片，用X射线荧光光谱法测量工作硅中铁，铝，钙，探讨了样片制备条件，并通过加入粘接剂提高了样片牢固度，用经验系数法进行元素间增强和吸收校正，经对样品制备精密度及测量准确度分析，X射线荧光光谱法测量准确度和精密度能满足传统化学法要求。
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| 关 键 词： | X射线荧光光谱 工业硅 铁 铝 钙 分析 |
| 修稿时间： | 2000年11月30 |
Determination of Fe, Al, Ca in Silicon Metal by XRF Spectrometry |
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| Songhai GU and Xuhui LI Tianjin Entry Exit Inspection and Quarantine Bureau of the P.R.China, Tianjin.Determination of Fe, Al, Ca in Silicon Metal by XRF Spectrometry[J].Spectroscopy and Spectral Analysis,2001,21(4):569-571. |
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| Authors: | Songhai GU and Xuhui LI Tianjin Entry Exit Inspection and Quarantine Bureau of the PRChina Tianjin |
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| Institution: | Tianjin Entry-Exit Inspection and Quarantine Bureau of the P. R. China, 300201 Tianjin. |
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| Abstract: | Fe,Al,Ca in silicon metal were measured by XRF using powder pressed method to prepare the sample.The conditions of preparing the sample disc were discussed, and the strength of the sample disc,was solidified through the binder added.Interelement absorption and enhancement effects are corrected by using the experience coefficient method.The precision and accuracy of the XRF method are excellent as compared with classical chemical method. |
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| Keywords: | XRF spectrometry Silicon metal |
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