Effect of post-deposition annealing on structural and electrical properties of high-k HoTiO3 gate dielectrics |
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Authors: | Tung-Ming Pan Li-Chen Yen Sheng-Han Su |
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Affiliation: | Department of Electronics Engineering, Chang Gung University, 259 Wen-Hwa, 1st Road, Kwei-Shan, Taoyuan 333, Taiwan, ROC |
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Abstract: | In this article, the authors developed a high-k HoTiO3 gate dielectric deposited on Si (1 0 0) through reactive cosputtering. They found that the HoTiO3 dielectrics annealed at 800 °C exhibited excellent electrical properties such as high capacitance value, small density of interface state, almost no hysteresis voltage, and low leakage current. This phenomenon is attributed to the decrease in intrinsic defect (related to oxygen vacancy) due to a rather well-crystallized HoTiO3 structure and composition observed by X-ray diffraction, secondary ion mass spectrometry, and X-ray photoelectron spectroscopy, respectively. |
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Keywords: | High-k HoTiO3 Gate dielectric |
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