Investigation of the hemoglobin adsorption in porous silicon by the ellipsometry method |
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| Authors: | V V Bolotov N A Davletkil’deev A A Korotenko E Yu Mosur O Yu Proskurina and Yu A Sten’kin |
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| Abstract: | The hemoglobin adsorption in porous silicon is studied by the method of spectroscopic ellipsometry. The layer-by-layer component
distribution in the porous silicon-hemoglobin system shows that hemoglobin molecules penetrate through the porous layer with
a slight gradient of the protein volume fraction. |
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