Electron screening in backward elastic scattering |
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Authors: | F. Schümann S. Zavatarelli L. Gialanella U. Greife M. Junker D. Rogalla C. Rolfs F. Strieder H.P. Trautvetter |
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Affiliation: | Institut für Physik mit Ionenstrahlen, Ruhr-Universit?t, Bochum, Universit?tsstr. 150, D-44780 Bochum, Germany, DE Dipartimento di Fisica, Università di Genova and INFN, Via Dolecaneso, I-16146 Genova, Italy, IT
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Abstract: | Abstact: The elastic scattering cross sections, σ (E,θ), for the systems He+Ta and He+W have been measured at θlab=165° and E lab=76.1 keV to 3.988 MeV using targets with a thickness of a few atomic layers. The results are smaller than the results given by the Rutherford scattering law, σR(E,θ), due to the effects of electron screening and can be described by σ(E,θ)/σR(E,θ)=(1+Ue/E)−1, where U e is an atomic screening potential energy. The deduced average value, U e=28 ± 3 keV, is consistent with the Moliére- and Lenz-Jensen-models as well as electron binding energies. Received: 25 May 1998 |
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Keywords: | PACS:25.60.Bx Elastic scattering |
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