| 光学元件群延迟的直接测量 |
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| 引用本文： | 邓玉强,孙青,于靖. 光学元件群延迟的直接测量[J]. 物理学报, 2011, 60(2): 28102-028102 |
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| 作者姓名： | 邓玉强 孙青 于靖 |
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| 作者单位： | 中国计量科学研究院光学所,北京 100013 |
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| 基金项目： | 国家科技支撑计划(批准号:2006BAF06B05)和中国计量科学研究院基本科研业务费(批准号:AKY0904,AKY0748)资助的课题. |
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| 摘 要： | 提出了一种测量群延迟的新方法,利用白光干涉仪产生的光谱干涉,通过时间频率联合分析直接得出群延迟,减小了传统相位差分方法产生的误差,并通过测量结果减去系统背景,进一步提高了光学元件色散测量的准确度. 该方法适合于具有复杂色散光学元件群延迟和色散的准确测量,也适合于慢光器件群速度延迟的测量.关键词：色散测量白光干涉时间频率分析超快激光
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| 关 键 词： | 色散测量 白光干涉 时间频率分析 超快激光 |
| 收稿时间： | 2010-01-04 |
| 修稿时间： | 2010-05-08 |
Direct measurement of group delay of optical elements |
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| Deng Yu-Qiang,Sun Qing,Yu Jing. Direct measurement of group delay of optical elements[J]. Acta Physica Sinica, 2011, 60(2): 28102-028102 |
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| Authors: | Deng Yu-Qiang Sun Qing Yu Jing |
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| Affiliation: | Optics Division, National Institute of Metrology, Beijing 100013, China;Optics Division, National Institute of Metrology, Beijing 100013, China;Optics Division, National Institute of Metrology, Beijing 100013, China |
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| Abstract: | A technique for direct measurement of group delay of optical elements is introduced. With the joint time-frequency analysis of white-light spectral interferogram, group delay can be directly extracted from the ridge of wavelet-transform. The technique is accurate and simple. The measurement results of group delay and group delay dispersion of a piece of fused silica was demonstrated. The results agree well with those from theoretical calculation, and the noise is greatly reduced. This technique is suitable for various application of white-light interferometer. |
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| Keywords: | dispersion measurement white-light interference time-frequency analysis ultrafast laser |
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