Moiré interferometry with ±45-deg gratings

Specimen gratings with rulings oriented +45 deg and ?45 deg to they axis can be used to determine theu andv displacement fields, i.e., the displacements in thex andy directions. The fringe patterns are identical to those obtained with (X) and (Y) specimen gratings. The analysis leading to this conclusion is presented. A vector quantity related to the fringe gradient in the interference pattern is defined and found effective for visualizing and describing the image-forming rays. Advantages relate to construction of apparatus for moiré interferometry.