High-resolution transmission electron microscopy on silicon carbide whiskers |
| |
Authors: | Mohamed Benaissa Jacques Werckmann Gabrielle Ehret Jean Guille Eric Peschiera |
| |
Institution: | (1) IPCMS- Groupe Surfaces-Interfaces, UMR 46 du CNRS, Université Louis Pasteur, 4 Rue Blaise Pascal, 67070 Strasbourg, France;(2) IPCMS-Groupe des Matériaux Inorganiques, UMR 46 du CNRS, EHICS, 1 Rue Blaise Pascal, 67008 Strasbourg, France |
| |
Abstract: | SiC whiskers were grown from the reaction of silicon monoxide (SiO) with activated carbon containing iron impurities. Growth proceeds through a VLS growth mechanism with SiO and CO as reacting gases. HRTEM combined with EDS shows that the SiC whisker is topped by a Fe3Si catalyst droplet. The SiC whisker is found to be one-dimensionally disordered along the 111] growth direction of an fcc crystal structure. Although the catalyst droplet is usually larger than the top face of the whisker, we observed a number of situations where the diameter of the droplet was smaller. The study of the SiC-Fe3Si interface showed that the growth is nucleated from the edges. |
| |
Keywords: | SiC whisker HRTEM iron VLS |
本文献已被 SpringerLink 等数据库收录! |
|