材料化学分析的物理方法(Ⅰ)

材料的化学信息是理解科学、工程与技术领域各种过程、机制和材料行为的最基本要素，材料研究的第一步是要确定材料的化学，包括构成材料的原子的种类、分布以及具体的化学态等内容，任何具有元素特征的物理信息，包括原子量、电子的能级、原子核自旋，甚至局域的电子态密度等都可以用来做材料的化学分析，化学信息由来自材料本身的或用作探针的电子、光子、离子或中性原子携带，相应的分析技术包括X射线光电子能谱、俄歇电子谱、核磁共振、特征X射线分析、二次离子质谱、能量损失谱、溅射中性粒子质谱，各类离子散射谱以及扫描隧道显微学方法等等，文章对上述各种分析方法的物理原理、仪器以及应用等逐一做扼要的介绍。

Physical methods for the chemical analysis of materials

Chemical information of materials is essential to the understanding of all kinds of processes, mechanisms and properties of materials in science, engineering, and technology. The first step in materials research is to determine the chemistry of the materials under investigation, including the types of component atoms, their distribution and the chemical states of atoms. Any element-specific physical signal can be exploited for the identification of atoms in the material, these are the atomic mass, electronic energy levels, nuclear spin and even the local electronic density of states at surface, etc. The chemical information is conveyed by photons, electrons, and atoms both ionized and neutral, which either come from the materials or are supplied as a probe. Accordingly, the following physical methods for chemical analysis have been developed: X-ray photoelectron spectroscopy, Auger electron spectroscopy, nuclear magnetic resonance, analysis of characteristic X-ray,secondary ion mass spectrometry, sputtered neutral mass spectrometry, electron energy loss spectroscopy, various forms of ion scattering spectrometry, and scanning tunneling microscopy. In this article a brief introduction to the physical principles, instrumentation and possible applications of the aforementioned methods is presented.