Mapping concentration profiles within the diffusion layer of an electrode: Part II. Potentiometric measurements with an ultramicroelectrode |
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Affiliation: | 1. Graduate Institute of Photonics and Optoelectronics, National Taiwan University, Taipei 106, Taiwan, ROC;2. Department of Electrophysics, National Chiao Tung University, Hsinchu 300, Taiwan, ROC;3. Department of Opto-Electronic Engineering, National Dong Hwa University, Hualien 974, Taiwan, ROC |
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Abstract: | A platinum-disk ultramicroelectrode is used to monitor electrochemical potential variations inside the steady-state diffusion layer created by a larger electrode. The experimental potential variations result from combination of a pure electrochemical component (viz., as given by the Nernst law) with a smaller ohmic drop contribution, which varies linearly with the distance from the working electrode surface so that it can be readily eliminated. From the ensuing corrected potential variations, the concentration profiles of the electroactive species present within the diffusion layer can be reconstructed by application of the Nernst law. The validity and great interest of the method are demonstrated experimentally by the study of the one-electron reversible oxidation of the Fe(CN)63−/Fe(CN)64− couple in aqueous KCl solutions. As a correlation, this demonstrates also for the first time the validity of the Nernst layer approximation. The method is then applied to examine the specific structure of the diffusion layers, which result from the involvement of a conproportionation reaction during the second reduction of tetracyanoquinodimethane (TCNQ) in DMF. |
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