| Abstract: | Raman spectroscopy and multivariate calibration techniques are used to determine the percentage conversion of zircon (ZrSiO4) to plasma‐dissociated zircon, ZrO2.SiO2 (PDZ). The integrated area of a consistent ZrO2 (monoclinic) Raman band at 477 cm–1 assigned to the Ag symmetry type from different conversion percentages of the PDZ spectra is used in a multivariate analysis scheme (partial least squares) to develop a predictive model for the subsequent determination of percentage dissociation of zircon to PDZ. In contrast to wet chemical methods, this approach eliminates the use of corrosive acids, e.g. hydrofluoric acid, thus leading to significant reductions in analysis time and material wastage, and it is a quick method that can be used online in a PDZ production facility. These results show best correlation with determination coefficient (R2) values in the range between 99.45 and 99.99% for zircon percentage dissociation in cross‐validation tests. This illustrates not only the versatility of the Raman technique in industrial applications but also the importance of noninvasive testing in the study of zircon and related materials. Copyright © 2011 John Wiley & Sons, Ltd. |
