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Low energy electron microscopy of surfaces |
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| Authors: | W. Telieps E. Bauer |
| Affiliation: | Physikalisches Institut, Technische Universität Clausthal and SFB 126 Göttingen/Clausthal, D-3392, Clausthal-Zellerfela, Fed. Rep. of Germany |
| Abstract: | In low energy electron microscopy (LEEM) surfaces are imaged with LEED electrons. Either the (00) beam (bright field mode) or one of the other diffracted beams (dark field mode) can be used for producing a true (non scanning) image of the surface. One can also obtain the LEED pattern of the illuminated area (typically 5–10 μm diameter) on the final screen. |
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