Metallization thickness in bilateral and unilateral Finlines |
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Authors: | Humberto César Chaves Fernandes Eduardo Amorim Martins de Souza and Idalmir de Souza Queiroz Júnior |
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Institution: | (1) Department of Electrical Engineering Technological Center, Federal University of Rio Grande do Norte, 59072-970 Natal-RN, Brazil |
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Abstract: | The theory and numerical results are presented to the effective dielectric constant and characteristic impedance of bilateral and unilateral finlines with metallization thickness. The full wave analysis of the transverse transmission line — TTL method is used to determine the electromagnetic fields of the structure in Fourier transform domain — FTD. Applying the suitable boundary conditions and the moment method, a homogeneous matrix system is obtained and the effective dielectric constant is extracted. The characteristic impedance is obtained using the relation between the voltage in slot and the transmitted power.Computational programs are developed to obtain numerical results to the effective dielectric constant and characteristic impedance. |
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Keywords: | Millimeter waves Finlines thickness TTL method |
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