首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Metallization thickness in bilateral and unilateral Finlines
Authors:Humberto César Chaves Fernandes  Eduardo Amorim Martins de Souza and Idalmir de Souza Queiroz Júnior
Institution:(1) Department of Electrical Engineering Technological Center, Federal University of Rio Grande do Norte, 59072-970 Natal-RN, Brazil
Abstract:The theory and numerical results are presented to the effective dielectric constant and characteristic impedance of bilateral and unilateral finlines with metallization thickness. The full wave analysis of the transverse transmission line — TTL method is used to determine the electromagnetic fields of the structure in Fourier transform domain — FTD. Applying the suitable boundary conditions and the moment method, a homogeneous matrix system is obtained and the effective dielectric constant is extracted. The characteristic impedance is obtained using the relation between the voltage in slot and the transmitted power.Computational programs are developed to obtain numerical results to the effective dielectric constant and characteristic impedance.
Keywords:Millimeter waves  Finlines thickness  TTL method
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号