| 低噪声放大器有意电磁干扰效应 |
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| 引用本文： | 汪海洋, 周翼鸿, 李家胤, 等. 低噪声放大器有意电磁干扰效应[J]. 强激光与粒子束, 2011, 23(11). |
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| 作者姓名： | 汪海洋 周翼鸿 李家胤 许立刚 于秀云 |
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| 作者单位： | 1.电子科技大学 物理电子学院, 成都 61 0054 |
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| 基金项目： | supported by National High-Tech Research and Development Program |
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| 摘 要： | 低噪声放大器(LNA)是高功率微波“前门”效应典型薄弱器件之一。通过SPICE效应电路建模、模拟计算和注入实验，研究了LNA在不同微波脉宽、功率参数下其增益压制效应规律。模拟结果与实验数据获得良好一致，表明基于SPICE电路模型微波效应研究方法的有效性。研究表明，LNA增益压制脉宽随注入微波脉冲脉宽的增大具有饱和效应，该饱和值基本等于LNA直流偏置电路RC时间常数，并且出现饱和现象对应注入微波脉宽拐点约为150~250 ns。最后，给出了LNA微波脉冲效应定性物理解释和机理探讨。
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| 关 键 词： | 低噪声放大器 有意电磁干扰 高功率微波 直接注入实验 |
| 收稿时间： | 1900-01-01; |
LNA malfunctions under intentional electromagnetic interference |
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| wang haiyang, zhou yihong, li jiayin, et al. LNA malfunctions under intentional electromagnetic interference[J]. High Power Laser and Particle Beams, 2011, 23. |
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| Authors: | Wang Haiyang Zhou Yihong Li Jiayin Xu Ligang Yu Xiuyun |
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| Affiliation: | 1. School of Physical Electronics,University of Electronic Science and Technology of China,Chengdu 610054,China |
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| Abstract: | This paper studies low noise amplifier(LNA) failures under intentional electromagnetic environment(IEME) through SPICE simulation and direct injection experiment.The classic single-stage studied has strong gain suppression effects when superimposed with high-power microwave(HPM) pulse at input port.Both theoretical and experimental results obtained highlight that the SPICE model can be used to assess IEMI effects.The LNA gain-suppression duration will keep the maximum value when the injected microwave pulse... |
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| Keywords: | low noise amplifier intentional electromagnetic interference high-power microwave direct injection experiment |
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