Core-level X-ray photoelectron spectra and X-ray photoelectron diffraction of RuO2(110) grown by molecular beam epitaxy on TiO2(110) |
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| Authors: | Y. J. Kim Y. Gao S. A. Chambers |
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| Affiliation: | Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, WA 99352, USA |
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| Abstract: | We have measured Ru 3d, 4s, 4p and O 1s high-resolution core-level X-ray photoelectron spectra, along with Ru 3d and O 1s scanned-angle X-ray photoelectron diffraction angular distributions, for RuO2(110). The surfaces were prepared by oxygen-plasma-assisted molecular beam epitaxial growth of RuO2 on TiO2(110). XPS spectral interpretation and the nature of the XPD scans strongly suggest that the complex line shapes are due to final-state screening effects, rather than the presence of Ru in oxidation states other than +4. |
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