Analysis of Internal Stress in a Tape Subsrate Made of the AISI 310S Stainless Steel for the Second-Generation HTS Wires Using Neutron Stress Diffractometry |
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| Authors: | Karpov I D Irodova A V Kruglov V S Shavkin S V Em V T |
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| Institution: | 1.National Research Center Kurchatov Institute, 123182, Moscow, Russia
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| Abstract: | Technical Physics - Neutron stress diffractometry is used to study internal (residual) stress in a tape made of the AISI 310S stainless steel with a thickness of 100 μm and a width of 4 mm in... |
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