Application of X-ray structure factor measurements to graphite intercalation compounds |
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| Authors: | SY Leung C Underhill G Dresselhaus T Krapchev R Ogilvie MS Dresselhaus |
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| Institution: | Massachusetts Institute of Technology, Cambridge, MA 02139, USA |
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| Abstract: | We report here two new applications of (00l) X-ray scattering intensity data for graphite intercalation compounds, yielding the structure of sandwich intercalates, as in metal chloride compounds, and an estimate of the state index via the l-value at maximum scattering intensity. |
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