Improvedp/n junctions in Ge-doped GaAs grown by molecular beam epitaxy

The effects of single-pulse ruby laser irradiation have been investigated in Si samples with disorder layers located at a depth of 2000 Å from the crystal surface and extending up to 8000 Å. This disorder was obtained by implantation with 350 keV N⁺ to a fluence of 2×10¹⁶/cm². Channeling, diffraction and transmission electron microscopy were used to characterize the structure of the irradiated layers. After 1.5 J/cm² irradiation the damaged layer reorders partially, while for about 2.0J/cm² the surface single crystal becomes polycrystalline. At a higher energy density all the material undergoes the transition to single crystal. Calculations based on the liquid model accounts in part for the experimental results.