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Dispersion effect on the current voltage characteristic of A1GaN/GaN high electron mobility transistors
Authors:Pu Yan Pang Lei Chen Xiao-Juan Yuan Ting-Ting Luo Wei-Jun and Liu Xin-Yu
Affiliation:Key Laboratory of Microelectronics Device & Integrated Technology,Institute of Microelectronies, Chinese Academy of Sciences, Beijing 100029, China
Abstract:
Keywords:dispersion effects   pulsed current voltage measurement   trap   self-heating
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