CsPbBr3单晶薄膜制备及其X射线探测性能研究

X射线探测在医疗、工业无损检测、国土安全等领域具有重要意义。制备高灵敏度的X射线探测器可以降低X射线剂量,在医疗和安检中至关重要。本文系统研究了采用空间限域法制备的高质量CsPbBr₃单晶薄膜,并用该薄膜制备出了性能良好的X射线探测器。借助偏光显微镜、扫描电子显微镜及其配备的能谱系统和背散射电子衍射系统对薄膜的形貌、厚度、成分和取向进行了分析。研究发现所制备的单晶薄膜表面平整、光滑,元素分布均匀,晶体取向均一。利用该薄膜制备的探测器具有较高电阻率(约7.23×10⁸ W·cm)和极高的灵敏度(约2 610 μC·Gy^-1·cm^-2)。

Fabrication of CsPbBr3 Single-Crystal Film and Its X-Ray Detection Performance

X-ray detection is of great significance for medical diagnostics, security inspection, and homeland security. The fabrication of a high-sensitivity X-ray detector can reduce the X-ray dose, especially in medical and security inspections. In this paper, the high-quality CsPbBr₃ single-crystal film was prepared by a space-confined method. Then an X-ray detector with good performance based on the film were fabricated. The morphology, thickness, composition, and orientation of the films were analyzed by the polarizing microscope, scanning electron microscope equipped with EDS, and EBSD detector. It is found that the prepared single-crystal films have a flat, smooth surface, uniform element distribution, and homogeneous crystal orientation. The detector has high resistivity of 7.23×10⁸ W·cm and an extremely high sensitivity of 2 610 μC·Gy^-1·cm^-2.