Depth sensitivity of X-e− coincidence Mössbauer scattering spectra |
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| Authors: | J. J. Bara B. F. Bogacz |
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| Affiliation: | (1) Institute of Physics, Jagellonian University, Reymonta 4, 30-059 Cracow, Poland |
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| Abstract: | The performance of the X-ray — e− coincidence technique for recording depth selective57Fe CEMS spectra was investigated. The technique proved useful for selection of K-shell conversion electrons (7.3 keV) from a beam of back scattered electrons. This makes it possible to observe the depth sensitivity of CEMS spectra recorded with an He/CH4 flow proportional counter. |
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