| 碳膜的制备及其在纳米颗粒观察中的应用 |
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| 引用本文： | 杨广,胡君遂,堵永国,张家春.碳膜的制备及其在纳米颗粒观察中的应用[J].分析测试技术与仪器,1998,4(1):26-28. |
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| 作者姓名： | 杨广 胡君遂 堵永国 张家春 |
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| 作者单位： | 国防科技大学五系 |
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| 摘 要： | 阐述了透射电镜中碳膜的制备方法，并讨论了影响碳膜质量的因素，用这种碳膜支持纳米颗粒在透射电镜下观察，碳膜在电子束的长时间照射下，不姓变形和起皱图象清晰衬底均匀。
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| 关 键 词： | 碳膜 纳米材料 电子显微分析 电子显微镜 分析 |
| 收稿时间： | 1997/10/28 0:00:00 |
| 修稿时间： | 1997/12/17 0:00:00 |
Preparation of Carbon Film and Its Application in Nanometer Powders Observation |
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| Yang Guang,Hu Junsui,Du Yongguo and Zhang Jiachun.Preparation of Carbon Film and Its Application in Nanometer Powders Observation[J].Analysis and Testing Technology and Instruments,1998,4(1):26-28. |
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| Authors: | Yang Guang Hu Junsui Du Yongguo and Zhang Jiachun |
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| Institution: | National University of Defence Technology Changsha 410073 |
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| Abstract: | The preparation method of carbon film in transmission electron microscopy(TEM) was stated. The influence factors on quality of carbon film were discussed. The carbon film was used for supporting nanometer powders. When it was irradiated by electron beam for long time in TEM, the carbon film was not deformation and not wrinkle. The image of microstructure was clear, and the contrast of the image was uniform. |
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| Keywords: | carbon film nanometer material electron microscopy analysis |
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