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Infrared radiation emitted due to scanning of a hot spot as a probe of hidden defects |
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| Institution: | 1. Center for Applied Mathematics, Cornell University, Ithaca, NY 14850, United States;2. School of Civil and Environmental Engineering, Cornell University, Ithaca, NY 14850, United States;1. College of Computer and Information Science, Chongqing Normal University, Chongqing 400047, China;2. Beijing Key Laboratory for Terahertz Spectroscopy and Imaging, Key Laboratory of Terahertz Optoelectronics, Ministry of Education, Department of Physics, Capital Normal University, Beijing 100048, China;3. Sinomatech Wind Power Blades Co., Ltd., Beijing 100092, China |
| Abstract: | Specially created subsurface defects in a sample are detected using a high resolution infrared camera FLIR SC7000. A scanning hot air (about 110 °C) nozzle is applied to introduce additional energy in a researched sample. The hidden defect has an increased temperature in comparison with the surrounding area that is a result of changed emissivity and thermal diffusivity. The suggested method is compared with pulse thermography which uses a xenon lamp for excitation. |
| Keywords: | Thermography Defect Scanning Noninvasive control |
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