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Manifestation of a size effect in the behavior of the intrinsic absorption edge of nanostructured polycrystalline zinc oxide thin films
Authors:B I Turko  V B Kapustyanyk  V P Rudyk  M V Partika  M V Kvasnytsya  A P Vas’kiv
Institution:(1) Scientific Technical and Educational Center for Low-Temperature Studies, Ivan Franko L’vov National University, 50 ul. Dragomanova, L’vov, 79005, Ukraine
Abstract:We have studied the behavior of the intrinsic absorption edge in zinc oxide thin films in the temperature range 80–300 K. We have observed that the intrinsic absorption edge in films with crystal sizes of ≈45 nm or larger is described by the empirical Urbach’s rule, while in films with crystallite sizes of ≈15 nm, it is described by a modified Urbach’s rule. We have calculated the effective frequency of phonons taking part in formation of the absorption edge. __________ Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 74, No. 2, pp. 275–277, March–April, 2007.
Keywords:zinc oxide  thin film  absorption edge  modified Urbach’  s rule  phonon frequency
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