Manifestation of a size effect in the behavior of the intrinsic absorption edge of nanostructured polycrystalline zinc oxide thin films |
| |
Authors: | B I Turko V B Kapustyanyk V P Rudyk M V Partika M V Kvasnytsya A P Vas’kiv |
| |
Institution: | (1) Scientific Technical and Educational Center for Low-Temperature Studies, Ivan Franko L’vov National University, 50 ul. Dragomanova, L’vov, 79005, Ukraine |
| |
Abstract: | We have studied the behavior of the intrinsic absorption edge in zinc oxide thin films in the temperature range 80–300 K.
We have observed that the intrinsic absorption edge in films with crystal sizes of ≈45 nm or larger is described by the empirical
Urbach’s rule, while in films with crystallite sizes of ≈15 nm, it is described by a modified Urbach’s rule. We have calculated
the effective frequency of phonons taking part in formation of the absorption edge.
__________
Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 74, No. 2, pp. 275–277, March–April, 2007. |
| |
Keywords: | zinc oxide thin film absorption edge modified Urbach’ s rule phonon frequency |
本文献已被 SpringerLink 等数据库收录! |
|